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Número de pieza | STU7LN80K5 | |
Descripción | N-channel Power MOSFET | |
Fabricantes | STMicroelectronics | |
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No Preview Available ! STU7LN80K5
N-channel 800 V, 0.95 Ω typ., 5 A MDmesh™ K5
Power MOSFET in a IPAK package
Datasheet - production data
TAB
IPAK
3
2
1
Figure 1: Internal schematic diagram
Features
Order code
STU7LN80K5
VDS
800 V
RDS(on) max.
1.15 Ω
ID
5A
• Industry’s lowest RDS(on) x area
• Industry’s best figure of merit (FoM)
• Ultra-low gate charge
• 100% avalanche tested
• Zener-protected
Applications
• Switching applications
Description
This very high voltage N-channel Power
MOSFET is designed using MDmesh™ K5
technology based on an innovative proprietary
vertical structure. The result is a dramatic
reduction in on-resistance and ultra-low gate
charge for applications requiring superior power
density and high efficiency.
Order code
STU7LN80K5
Table 1: Device summary
Marking
Package
7LN80K5
IPAK
Packing
Tube
January 2016
DocID028830 Rev 1
This is information on a product in full production.
1/12
www.st.com
1 page STU7LN80K5
Symbol
Parameter
Table 8: Source drain diode
Test conditions
Electrical characteristics
Min. Typ. Max. Unit
ISD
ISDM(1)
VSD (2)
trr
Qrr
IRRM
Source-drain current
Source-drain current
(pulsed)
Forward on voltage
Reverse recovery time
Reverse recovery
charge
Reverse recovery
current
ISD= 5 A, VGS = 0 V
ISD = 5 A, di/dt = 100 A/µs,
VDD = 60 V (see Figure 16: "Test
circuit for inductive load
switching and diode recovery
times")
- 5A
- 20 A
- 1.6 V
- 276
ns
- 2.13
µC
- 15.4
A
trr Reverse recovery time
Qrr
Reverse recovery
charge
IRRM
Reverse recovery
current
ISD = 5 A, di/dt = 100 A/µs,
VDD = 60 V, Tj = 150 °C
(see Figure 16: "Test circuit for
inductive load switching and
diode recovery times")
- 402
- 2.79
- 13.9
ns
µC
A
Notes:
(1)Pulse width is limited by safe operating area
(2)Pulsed: pulse duration = 300 µs, duty cycle 1.5%
Symbol
V(BR)GSO
Table 9: Gate-source Zener diode
Parameter
Test conditions
Gate-source breakdown voltage IGS = ±1 mA, ID = 0 A
Min. Typ. Max. Unit
30 -
V
The built-in back-to-back Zener diodes are specifically designed to enhance the ESD
performance of the device. The Zener voltage facilitates efficient and cost-effective device
integrity protection,thus eliminating the need for additional external componentry.
DocID028830 Rev 1
5/12
5 Page STU7LN80K5
Revision history
5 Revision history
Date
08-Jan-2016
Table 11: Document revision history
Revision
Changes
1 First release.
DocID028830 Rev 1
11/12
11 Page |
Páginas | Total 12 Páginas | |
PDF Descargar | [ Datasheet STU7LN80K5.PDF ] |
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