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PDF ESD8451N2T5G Data sheet ( Hoja de datos )
| Número de pieza | ESD8451N2T5G | |
| Descripción | ESD Protection Diodes | |
| Fabricantes | ON Semiconductor | |
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ESD8451, SZESD8451
ESD Protection Diodes
Low Capacitance ESD Protection Diode
for High Speed Data Line
The ESD8451 Series ESD protection diodes are designed to protect
high speed data lines from ESD. Ultra−low capacitance and low ESD
clamping voltage make this device an ideal solution for protecting
voltage sensitive high speed data lines.
Features
• Low Capacitance (0.30 pF Max, I/O to GND)
• Protection for the Following IEC Standards:
IEC 61000−4−2 (Level 4)
ISO10605 330 pF / 2 kW ±30 kV Contact
• Low ESD Clamping Voltage
• SZ Prefix for Automotive and Other Applications Requiring Unique
Site and Control Change Requirements; AEC−Q101 Qualified and
PPAP Capable
• These Devices are Pb−Free, Halogen Free/BFR Free and are RoHS
Compliant
Typical Applications
• USB 3.0
• MHL 2.0
• eSATA
MAXIMUM RATINGS (TJ = 25°C unless otherwise noted)
Rating
Symbol
Value
Unit
Operating Junction Temperature Range TJ −55 to +125 °C
Storage Temperature Range
Tstg − 55 to +150 °C
Lead Solder Temperature −
Maximum (10 Seconds)
TL 260 °C
IEC 61000−4−2 Contact (ESD)
IEC 61000−4−2 Air (ESD)
ESD
ESD
±15 kV
±15 kV
Stresses exceeding those listed in the Maximum Ratings table may damage the
device. If any of these limits are exceeded, device functionality should not be
assumed, damage may occur and reliability may be affected.
www.onsemi.com
X3DFN2
CASE 152AF
MARKING
DIAGRAMS
PIN 1
M
XDFN2
CASE 711AM
AM
G
P, A = Specific Device Code
M = Date Code
PIN CONFIGURATION
AND SCHEMATIC
12
ORDERING INFORMATION
See detailed ordering and shipping information in the package
dimensions section on page 7 of this data sheet.
See Application Note AND8308/D for further description of
survivability specs.
© Semiconductor Components Industries, LLC, 2015
February, 2015 − Rev. 4
1
Publication Order Number:
ESD8451/D
1 page  
ESD8451, SZESD8451
Latch−Up Considerations
ON Semiconductor’s 8000 series of ESD protection
devices utilize a snap−back, SCR type structure. By using
this technology, the potential for a latch−up condition was
taken into account by performing load line analyses of
common high speed serial interfaces. Example load lines for
latch−up free applications and applications with the
potential for latch−up are shown below with a generic IV
characteristic of a snapback, SCR type structured device
overlaid on each. In the latch−up free load line case, the IV
characteristic of the snapback protection device intersects
the load−line in one unique point (VOP, IOP). This is the only
stable operating point of the circuit and the system is
therefore latch−up free. In the non−latch up free load line
case, the IV characteristic of the snapback protection device
intersects the load−line in two points (VOPA, IOPA) and
(VOPB, IOPB). Therefore in this case, the potential for
latch−up exists if the system settles at (VOPB, IOPB) after a
transient. Because of this, ESD8451 should not be used for
HDMI applications – ESD8104 or ESD8040 have been
designed to be acceptable for HDMI applications without
latch−up. Please refer to Application Note AND9116/D for
a more in−depth explanation of latch−up considerations
using ESD8000 series devices.
ESD8451 Latch*up free:
USB 2.0 LS/FS, USB 2.0 HS,
USB 3.0 SS, DisplayPort
ESD8451 Potential Latch*up:
HDMI 1.4/1.3a TMDS
Figure 11. Example Load Lines for Latch−up Free Applications and Applications with the Potential for Latch−up
Table 1. SUMMARY OF SCR REQUIREMENTS FOR LATCH−UP FREE APPLICATIONS
Application
VBR (min)
(V)
IH (min)
(mA)
VH (min)
(V)
ON Semiconductor ESD8000 Series
Recommended PN
HDMI 1.4/1.3a TMDS
3.465
54.78
1.0
ESD8104, ESD8040
USB 2.0 LS/FS
3.301
1.76
1.0
ESD8004, ESD8451
USB 2.0 HS
0.482
N/A
1.0
ESD8004, ESD8451
USB 3.0 SS
2.800
N/A
1.0
ESD8004, ESD8006, ESD8451
DisplayPort
3.600
25.00
1.0
ESD8004, ESD8006, ESD8451
www.onsemi.com
5
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