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PDF LTC2246H Data sheet ( Hoja de datos )

Número de pieza LTC2246H
Descripción ADC
Fabricantes Linear Technology 
Logotipo Linear Technology Logotipo



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FEATURES
n Sample Rate: 25Msps
n –40°C to 125°C Operation
n Single 3V Supply (2.8V to 3.5V)
n Low Power: 75mW
n 74.5dB SNR
n 90dB SFDR
n No Missing Codes
n Flexible Input: 1VP-P to 2VP-P Range
n 575MHz Full Power Bandwidth S/H
n Clock Duty Cycle Stabilizer
n Shutdown and Nap Modes
n Pin Compatible Family
LTC2246H (14-Bit), LTC2226H (12-Bit)
n 48-Pin (7mm × 7mm) LQFP Package
APPLICATIONS
n Automotive
n Industrial
n Wireless and Wired Broadband Communication
LTC2246H
14-Bit, 25Msps
125°C ADC In LQFP
DESCRIPTION
The LTC®2246H is a 14-bit 25Msps, low power 3V A/D
converter designed for digitizing high frequency, wide
dynamic range signals. The LTC2246H is perfect for
demanding imaging and communications applications
with AC performance that includes 74.5dB SNR and 90dB
SFDR.
DC specs include ±1LSB INL (typ), ±0.5LSB DNL (typ)
and no missing codes over temperature. The transition
noise is a low 1LSBRMS.
A single 3V supply allows low power operation. A separate
output supply allows the outputs to drive 0.5V to 3.6V
logic.
A single-ended CLK input controls converter operation. An
optional clock duty cycle stabilizer allows high performance
at full speed for a wide range of clock duty cycles.
L, LT, LTC, LTM, Linear Technology and the Linear logo are registered trademarks of Linear
Technology Corporation. All other trademarks are the property of their respective owners.
TYPICAL APPLICATION
REFH
REFL
ANALOG
INPUT
FLEXIBLE
REFERENCE
+
INPUT
S/H
CLOCK/DUTY
CYCLE
CONTROL
CLK
14-BIT
PIPELINED
ADC CORE
CORRECTION
LOGIC
OUTPUT
DRIVERS
OVDD
D13
D0
OGND
2246H TA01
2.0
1.5
1.0
0.5
0
–0.5
–1.0
–1.5
–2.0
0
Typical INL, 2V Range
4096
8192
CODE
12288 16384
2246H TA01b
2246hfb
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LTC2246H pdf
LTC2246H
ELECTRICAL CHARACTERISTICS
Note 1: Stresses beyond those listed under Absolute Maximum Ratings
may cause permanent damage to the device. Exposure to any Absolute
Maximum Rating condition for extended periods may affect device
reliability and lifetime.
Note 2: All voltage values are with respect to ground with GND and OGND
wired together (unless otherwise noted).
Note 3: When these pin voltages are taken below GND or above VDD, they
will be clamped by internal diodes. This product can handle input currents
of greater than 100mA below GND or above VDD without latchup.
Note 4: VDD = 3V, fSAMPLE = 25MHz, input range = 2VP-P with differential
drive, unless otherwise noted.
Note 5: Integral nonlinearity is defined as the deviation of a code from a
straight line passing through the actual endpoints of the transfer curve.
The deviation is measured from the center of the quantization band.
Note 6: Offset error is the offset voltage measured from –0.5 LSB when
the output code flickers between 00 0000 0000 0000 and
11 1111 1111 1111.
Note 7: Guaranteed by design, not subject to test.
Note 8: VDD = 3V, fSAMPLE = 25MHz, input range = 1VP-P with
differential drive.
Note 9: Recommended operating conditions.
TYPICAL PERFORMANCE CHARACTERISTICS
Typical INL, 2V Range, 25Msps
2.0
1.5
1.0
0.5
0
–0.5
–1.0
–1.5
–2.0
0
4096
8192
CODE
12288 16384
2246H G01
Typical DNL, 2V Range, 25Msps
1.00
0.75
0.50
0.25
0
–0.25
–0.50
–0.75
–1.00
0
4096
8192
CODE
12288 16384
2246H G02
8192 Point FFT, fIN = 5MHz, –1dB,
2V Range, 25Msps
0
–10
–20
–30
–40
–50
–60
–70
–80
–90
–100
–110
–120
0 2 4 6 8 10 12
FREQUENCY (MHz)
2246H G03
8192 Point FFT, fIN = 30MHz,
–1dB, 2V Range, 25Msps
0
–10
–20
–30
–40
–50
–60
–70
–80
–90
–100
–110
–120
0 2 4 6 8 10 12
FREQUENCY (MHz)
2246H G04
8192 Point FFT, fIN = 70MHz,
–1dB, 2V Range, 25Msps
0
–10
–20
–30
–40
–50
–60
–70
–80
–90
–100
–110
–120
0 2 4 6 8 10 12
FREQUENCY (MHz)
2246H G05
8192 Point FFT, fIN = 140MHz,
–1dB, 2V Range, 25Msps
0
–10
–20
–30
–40
–50
–60
–70
–80
–90
–100
–110
–120
0 2 4 6 8 10 12
FREQUENCY (MHz)
2246H G06
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LTC2246H arduino
LTC2246H
APPLICATIONS INFORMATION
DAC to produce a residue. The residue is amplified and
output by the residue amplifier. Successive stages operate
out of phase so that when the odd stages are outputting
their residue, the even stages are acquiring that residue
and vice versa.
When CLK is low, the analog input is sampled differentially
directly onto the input sample-and-hold capacitors, inside
the “Input S/H” shown in the block diagram. At the instant
that CLK transitions from low to high, the sampled input is
held. While CLK is high, the held input voltage is buffered
by the S/H amplifier which drives the first pipelined ADC
stage. The first stage acquires the output of the S/H dur-
ing this high phase of CLK. When CLK goes back low, the
first stage produces its residue which is acquired by the
second stage. At the same time, the input S/H goes back to
acquiring the analog input. When CLK goes back high, the
second stage produces its residue which is acquired by the
third stage. An identical process is repeated for the third,
fourth and fifth stages, resulting in a fifth stage residue
that is sent to the sixth stage ADC for final evaluation.
Each ADC stage following the first has additional range to
accommodate flash and amplifier offset errors. Results
from all of the ADC stages are digitally synchronized such
that the results can be properly combined in the correction
logic before being sent to the output buffer.
SAMPLE/HOLD OPERATION AND INPUT DRIVE
Sample/Hold Operation
Figure 2 shows an equivalent circuit for the LTC2246H
CMOS differential sample-and-hold. The analog inputs are
connected to the sampling capacitors (CSAMPLE) through
NMOS transistors. The capacitors shown attached to
each input (CPARASITIC) are the summation of all other
capacitance associated with each input.
During the sample phase when CLK is low, the transistors
connect the analog inputs to the sampling capacitors and
they charge to and track the differential input voltage. When
CLK transitions from low to high, the sampled input voltage
is held on the sampling capacitors. During the hold phase
when CLK is high, the sampling capacitors are disconnected
from the input and the held voltage is passed to the ADC
core for processing. As CLK transitions from high to low,
LTC2246H
VDD
15Ω
AIN+
VDD
15Ω
AIN
CPARASITIC
1pF
CPARASITIC
1pF
CSAMPLE
4pF
CSAMPLE
4pF
CLK
Figure 2. Equivalent Input Circuit
2246H F02
the inputs are reconnected to the sampling capacitors to
acquire a new sample. Since the sampling capacitors still
hold the previous sample, a charging glitch proportional
to the change in voltage between samples will be seen
at this time. If the change between the last sample and
the new sample is small, the charging glitch seen at the
input will be small. If the input change is large, such as
the change seen with input frequencies near Nyquist, then
a larger charging glitch will be seen.
Single-Ended Input
For cost sensitive applications, the analog inputs can be
driven single-ended. With a single-ended input the har-
monic distortion and INL will degrade, but the SNR and
DNL will remain unchanged. For a single-ended input, AIN+
should be driven with the input signal and AIN– should
be connected to VCM or a low noise reference voltage
between 1V and 1.5V.
Common Mode Bias
For optimal performance the analog inputs should be driven
differentially. Each input should swing ±0.5V for the 2V
range or ±0.25V for the 1V range, around a common mode
voltage of 1.5V. The VCM output pins (Pins 44, 45) may be
used to provide the common mode bias level. VCM can be
tied directly to the center tap of a transformer to set the DC
input level or as a reference level to an op amp differential
driver circuit. The VCM pins must be bypassed to ground
close to the ADC with a 2.2μF or greater capacitor.
2246hfb
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