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Número de pieza | LSM320HAY30 | |
Descripción | 3D digital accelerometer and 2D pitch and yaw analog gyroscope | |
Fabricantes | STMicroelectronics | |
Logotipo | ||
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MEMS motion sensor module:
3D digital accelerometer and 2D pitch and yaw analog gyroscope
Features
■ 2.7 V to 3.6 V power supply operation
■ Low voltage compatible digital IOs, 1.8 V
■ ±2 g/±4 g/±8 g dynamically selectable full-scale
■ ±300 dps absolute analog angular rate output
■ I2C/SPI digital linear acceleration interface (16
bit data output)
■ Two separated outputs for pitch and yaw axis
(1x and 4x amplified)
■ Integrated low-pass filters for angular rate
■ 2 independent programmable interrupt
generators for free-fall and motion detection
■ Sleep-to-wakeup function
■ 6D orientation detection
■ Extended operating temperature range (40 °C
to +85 °C)
■ High stability over temperature
■ High shock survivability
■ Embedded self-test
■ Embedded power-down
www.DataS■heeEt4mUb.ceomdded low-power mode
■ ECOPACK® RoHS and “Green” compliant
(see Section 9)
Applications
■ Motion control for smart user interface
■ Display orientation
■ Gaming and virtual reality input devices
■ Industrial and robotics
■ Vibration monitoring and compensation
■ Impact recognition and logging
■ Motion-activated functions
■ Intelligent power-saving for handheld devices
■ Free-fall detection
LGA-28L (4.4x7.5x1.1mm)
Description
The LSM320HAY30 is a low-power system-in-
package featuring a 3D digital linear acceleration
sensor and a 2D analog angular rate pitch and
yaw sensor. It provides excellent temperature
stability and high resolution over an extended
operating temperature range (-40°C to +85°C).
ST’s family of sensor modules leverages the
robust and mature manufacturing process already
used for the production of micromachined
accelerometers. The LSM320HAY30 has a
dynamically user-selectable full-scale
acceleration range of ±2 g/±4 g/±8 g, and an
angular rate of ±300 dps capable of detecting
rates with a -3 dB bandwidth up to 140 Hz along
pitch and yaw axes. The LSM320HAY30 is
capable of measuring linear accelerations with
output data rates from 0.5 Hz up to 1 kHz. The
embedded self-test capability allows the user to
check the functioning of each sensor in the final
application. The device can be configured to
generate an interrupt signal by inertial
wakeup/free-fall events as well as by the position
of the device itself. Several years ago ST
successfully pioneered the use of this package for
accelerometers. Today, ST has the widest
manufacturing capability and strongest expertise
in the world for production of sensors in plastic
LGA packages.
December 2009
Doc ID 16917 Rev 1
1/42
www.st.com
42
1 page LSM320HAY30
List of tables
Table 49.
Table 50.
Table 51.
Table 52.
Table 53.
Table 54.
Table 55.
LA_INT2_SRC description . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 36
LA_INT2_THS register . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 36
LA_INT2_THS description . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 36
LA_INT2_DURATION register . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 36
LA_INT2_DURATION description . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 36
Device summary . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 39
Document revision history . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 40
www.DataSheet4U.com
Doc ID 16917 Rev 1
5/42
5 Page LSM320HAY30
Mechanical and electrical specifications
Table 2. Mechanical characteristics (continued)
Symbol(1)
Parameter
Test conditions
Min. Typ.(2) Max.
Unit
AR_ST
Top
Angular rate self-test output
change
Operating temperature range
250 mV
-40 +85 °C
1. Linear acceleration (LA), Angular Rate (AR) parameter labeling
2. Typical specifications are not guaranteed
3. Verified by wafer level test and measurement of initial offset and sensitivity
4. Sensitivity and zero-rate offset are not ratiometric to supply voltage
5. Typical zero-g level offset value after MSL3 preconditioning
6. Offset can be eliminated by enabling the built-in high-pass filter
7. Refer to Table 23 for filter cut-off frequency.
8. The product is capable of measuring angular rates extending from DC to the selected BW.
9. The sign of “Self-test output change” is defined by LA_CTRL_REG4 STsign bit (Table 27), for all axes.
10. Linear acceleration sensing Self-Test output changes with the power supply. “Self-test output change” is defined as
OUTPUT[LSb](LA_CTRL_REG4 ST bit=1) - OUTPUT[LSb](LA_CTRL_REG4 ST bit=0). 1LSb=4g/4096 at 12bit representation, ±2 g
Full-scale
11. Output data reach 99% of final value after 1/ODR+1ms when enabling linear acceleration sensing self-test mode, due to
device filtering.
2.2 Electrical characteristics
@ Vdd=3,0 V, T=25 °C unless otherwise noted.(b)
Table 3. Electrical characteristics
Symbol
Parameter
Test condition
Vdd Supply voltage
Vdd_IO I/O pins supply voltage(2)
LA_Idd
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Linear acceleration current
consumption in normal mode
AR_Idd
Angular rate current consumption
in normal mode
ODR = 50 Hz
ARPD pin
connected to GND
LA_IddLP
Linear acceleration current
consumption in low-power mode
ODRLP = 0.5 Hz
AR_IddSl
Angular rate current consumption
in sleep mode
ARPD, ARST pin
connected to Vdd
LA_IddPdn
Linear acceleration current
consumption in power-down mode
AR_IddPdn
Angular rate current consumption
in power-down mode
ARPD pin
connected to Vdd
Min.
2.7
1.71
Typ.(1)
3.0
0.25
Max.
3.6
Vdd+0.1
Unit
V
V
mA
6.8 mA
10 µA
2.1 5 mA
1 µA
1 5 µA
b. The product is factory calibrated at 3 V.
Doc ID 16917 Rev 1
11/42
11 Page |
Páginas | Total 30 Páginas | |
PDF Descargar | [ Datasheet LSM320HAY30.PDF ] |
Número de pieza | Descripción | Fabricantes |
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