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PDF TE53N50E Data sheet ( Hoja de datos )

Número de pieza TE53N50E
Descripción MTE53N50E
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MOTOROLA
SEMICONDUCTOR TECHNICAL DATA
Order this document
by MTE53N50E/D
Designer's
Data Sheet
ISOTOP TMOS E-FET
.
Power Field Effect Transistor
MTE53N50E
Motorola Preferred Device
N–Channel Enhancement–Mode Silicon Gate
This advanced high voltage TMOS E–FET is designed to
withstand high energy in the avalanche mode and switch efficiently.
This new high energy device also offers a drain–to–source diode
with fast recovery time. Designed for high voltage, high speed
switching applications such as power supplies, PWM motor
controls and other inductive loads, the avalanche energy capability
is specified to eliminate the guesswork in designs where inductive
www.DataSheet4loUa.cdosmare switched and offer additional safety margin against
unexpected voltage transients.
2500 V RMS Isolated Isotop Package
Avalanche Energy Specified
Source–to–Drain Diode Recovery Time Comparable to a Discrete
Fast Recovery Diode
Diode is Characterized for Use in Bridge Circuits
Very Low Internal Parasitic Inductance
IDSS and VDS(on) Specified at Elevated Temperature
U. L. Recognized, File #E69369
G
MAXIMUM RATINGS (TC = 25°C unless otherwise noted)
Rating
TMOS POWER FET
53 AMPERES
500 VOLTS
RDS(on) = 0.080 OHM
®
4
13
2
D
S
Symbol
SOT–227B
1. Source
2. Gate
3. Drain
4. Source 2
Value
Unit
Drain–Source Voltage
Drain–Gate Voltage (RGS = 1.0 M)
Gate–Source Voltage — Continuous
Gate–Source Voltage — Non–Repetitive (tp 10 ms)
VDSS
VDGR
VGS
VGSM
500 Vdc
500 Vdc
± 20 Vdc
± 40 Vpk
Drain Current — Continuous
Drain Current — Continuous @ 100°C
Drain Current — Single Pulse (tp 10 µs)
ID 53 Adc
ID 33
IDM 210
Total Power Dissipation
Derate above 25°C
PD 460 Watts
3.70 W/°C
Operating and Storage Temperature Range
Single Pulse Drain–to–Source Avalanche Energy
(VDD = 25 Vdc, VGS = 10 Vdc, IL= 53 Apk, L = 0.29 mH, RG =25)
TJ, Tstg
EAS
– 40 to 150
400
°C
mJ
RMS Isolation Voltage
VISO
2500
Vac
Thermal Resistance — Junction to Case
Thermal Resistance — Junction to Ambient
RθJC
RθJA
0.28 °C/W
62.5
Maximum Lead Temperature for Soldering Purposes, 1/8from case for 10 seconds
TL 260 °C
Designer’s Data for “Worst Case” Conditions — The Designer’s Data Sheet permits the design of most circuits entirely from the information presented. SOA Limit
curves — representing boundaries on device characteristics — are given to facilitate “worst case” design.
E–FET is a trademark of Motorola, Inc. TMOS is a registered trademark of Motorola, Inc.
ISOTOP is a trademark of SGS–THOMSON Microelectronics.
Preferred devices are Motorola recommended choices for future use and best overall value.
REV 2
©MMoottoororolal,aInTc.M19O9S6 Power MOSFET Transistor Device Data
1

1 page




TE53N50E pdf
12
QT
10
420
350
8 VGS 280
6 Q1
4
Q2
ID = 53 A
TJ = 25°C
210
140
2 70
0 Q3
VDS
0 100 200 300 400
Qg, TOTAL GATE CHARGE (nC)
0
500
Figure 8. Gate–To–Source and
www.DataSheet4U.com Drain–To–Source Voltage versus Total Charge
10000
1000
VDD = 250 V
ID = 53 A
VGS = 10 V
TJ = 25°C
100
MTE53N50E
td(off)
tr
tf
td(on)
10
1 10 100
RG, GATE RESISTANCE (OHMS)
Figure 9. Resistive Switching Time
Variation versus Gate Resistance
SAFE OPERATING AREA
The Forward Biased Safe Operating Area curves define
the maximum simultaneous drain–to–source voltage and
drain current that a transistor can handle safely when it is for-
ward biased. Curves are based upon maximum peak junc-
tion temperature and a case temperature (TC) of 25°C. Peak
repetitive pulsed power limits are determined by using the
thermal response data in conjunction with the procedures
discussed in AN569, “Transient Thermal Resistance–General
Data and Its Use.”
Switching between the off–state and the on–state may tra-
verse any load line provided neither rated peak current (IDM)
nor rated voltage (VDSS) is exceeded and the transition time
(tr,tf) do not exceed 10 µs. In addition the total power aver-
aged over a complete switching cycle must not exceed
(TJ(MAX) – TC)/(RθJC).
A Power MOSFET designated E–FET can be safely used
in switching circuits with unclamped inductive loads. For reli-
able operation, the stored energy from circuit inductance dis-
sipated in the transistor while in avalanche must be less than
the rated limit and adjusted for operating conditions differing
from those specified. Although industry practice is to rate in
terms of energy, avalanche energy capability is not a con-
stant. The energy rating decreases non–linearly with an in-
crease of peak current in avalanche and peak junction
temperature.
60
VGS = 0 V
50 TJ = 25°C
40
30
20
10
0
0.5 0.6 0.7
0.8 0.9
1
VSD, SOURCE–TO–DRAIN VOLTAGE (VOLTS)
1.1
Figure 10. Diode Forward Voltage versus Current
Motorola TMOS Power MOSFET Transistor Device Data
5

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