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PDF AT28LV64B Data sheet ( Hoja de datos )

Número de pieza AT28LV64B
Descripción 64K 8K x 8 Low Voltage CMOS E2PROM with Page Write and Software Data Protection
Fabricantes ATMEL Corporation 
Logotipo ATMEL Corporation Logotipo



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AT28LV64B
Features
Single 3.3V ± 10% Supply
3-Volt-Only Read and Write Operation
Software-Protected Programming
•• Low Power Dissipation
15 mA Active Current
20 µA CMOS Standby Current
Fast Read Access Time 200 ns
Automatic Page Write Operation
Internal Address and Data Latches for 64-Bytes
Internal Control Timer
Fast Write Cycle Times
Page Write Cycle Time: 10 ms Maximum
1 to 64-Byte Page Write Operation
DATA Polling for End of Write Detection
•• High Reliability CMOS Technology
Endurance: 10,000 Cycles
Data Retention: 10 Years
JEDEC Approved Byte-Wide Pinout
•• Commercial and Industrial Temperature Ranges
Description
The AT28LV64B is a high-performance electrically erasable programmable read only
memory (EEPROM). Its 64K of memory is organized as 8,192 words by 8 bits. Manu-
factured with Atmel’s advanced nonvolatile CMOS technology, the device offers ac-
cess times to 200 ns with power dissipation of just 54 mW. When the device is dese-
lected, the CMOS standby current is less than 20 µA.
The AT28LV64B is accessed like a static RAM for the read or write cycle without the
need for external components. The device contains a 64-byte page register to allow
Pin Configurations
(continued)
Pin Name
A0 - A12
CE
OE
WE
I/O0 - I/O7
NC
DC
Function
Addresses
Chip Enable
Output Enable
Write Enable
Data Inputs/Outputs
No Connect
Don’t Connect
PDIP, SOIC
Top View
64K (8K x 8)
Low Voltage
CMOS
E2PROM with
Page Write and
Software Data
Protection
AT28LV64B
PLCC
Top View
TSOP
Top View
Note: PLCC package pins 1 and
17 are DON’T CONNECT.
0299C
2-135

1 page




AT28LV64B pdf
AC Read Characteristics
Symbol
tACC
tCE (1)
tOE (2)
tDF (3, 4)
tOH
Parameter
Address to Output Delay
CE to Output Delay
OE to Output Delay
CE or OE to Output Float
Output Hold from OE, CE or Address,
whichever occurred first
AC Read Waveforms (1, 2, 3, 4)
AT28LV64B
AT28LV64B-20
Min Max
200
200
0 80
0 55
0
AT28LV64B-25
Min Max
250
250
0 100
0 60
0
Units
ns
ns
ns
ns
ns
Notes: 1. CE may be delayed up to tACC - tCE after the address
transition without impact on tACC.
2. OE may be delayed up to tCE - tOE after the falling
edge of CE without impact on tCE or by tACC - tOE
after an address change without impact on tACC.
3. tDF is specified from OE or CE, whichever occurs first
(CL = 5 pF).
4. This parameter is characterized and is not 100% tested.
Input Test Waveforms and
Measurement Level
Output Test Load
tR, tF < 20 ns
Pin Capacitance (f = 1 MHz, T = 25°C) (1)
Typ Max
CIN 4 6
COUT
8 12
Note: 1. This parameter is characterized and is not 100% tested.
Units
pF
pF
Conditions
VIN = 0V
VOUT = 0V
2-139

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