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Número de pieza | BYQ28E-200 | |
Descripción | Rectifier diodes ultrafast | |
Fabricantes | NXP Semiconductors | |
Logotipo | ||
Hay una vista previa y un enlace de descarga de BYQ28E-200 (archivo pdf) en la parte inferior de esta página. Total 10 Páginas | ||
No Preview Available ! BYQ28 series E and ED
Rectifier diodes ultrafast, rugged
Rev. 04 — 5 December 2007
Product data sheet
1. Product profile
1.1 General description
Ultrafast, dual common cathode, epitaxial rectifier diodes in a SOT78 (TO-220AB) and a
SOT428 (DPAK) plastic package.
1.2 Features
I Fast switching
I Soft recovery characteristic
I Reverse surge capability
I Low thermal resistance
I Low forward voltage drop
I High thermal cycling performance
1.3 Applications
I Output rectifiers in high-frequency switched-mode power supplies
1.4 Quick reference data
I VRRM ≤ 200 V
I VF ≤ 0.895 V
2. Pinning information
I IO(AV) ≤ 10 A
I trr = 10 ns (typ)
Table 1. Pinning
Pin Description
1 anode 1
2 cathode
3 anode 2
mb mounting base; cathode
Simplified outline
[1] mb
Symbol
mb
13
2
sym084
2
13
SOT428 (DPAK)
123
SOT78 (3-lead TO-220AB)
[1] It is not possible to connect to pin 2 of the SOT428 package.
1 page NXP Semiconductors
BYQ28 series E and ED
Rectifier diodes ultrafast, rugged
IF
dlF
dt
trr
Qr
IR IRM
Fig 3. Reverse recovery definitions
IF
time
10 %
100 %
VF
001aab911
Fig 4. Forward recovery definitions
time
VFR
VF
time
001aab912
8
Ptot
(W)
6
4
2
0.2
0.1
001aag976
δ=1
0.5
6
Ptot
(W)
4
2
001aag977
a = 1.57
1.9
2.2
2.8
4.0
0
02468
IF(AV) (A)
IF(AV) = IF(RMS) × √δ
Fig 5. Forward power dissipation as a function of
average forward current; square waveform;
maximum values
0
0246
IF(AV) (A)
a = form factor = IF(RMS) / IF(AV)
Fig 6. Forward power dissipation as a function of
average forward current; sinusoidal waveform;
maximum values
BYQ28_SER_E_ED_4
Product data sheet
Rev. 04 — 5 December 2007
© NXP B.V. 2007. All rights reserved.
5 of 10
5 Page |
Páginas | Total 10 Páginas | |
PDF Descargar | [ Datasheet BYQ28E-200.PDF ] |
Número de pieza | Descripción | Fabricantes |
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