|
|
PDF Si8511 Data sheet ( Hoja de datos )
| Número de pieza | Si8511 | |
| Descripción | UNIDIRECTIONAL AC CURRENT SENSORS | |
| Fabricantes | Silicon Laboratories | |
| Logotipo |  |
|
Hay una vista previa y un enlace de descarga de Si8511 (archivo pdf) en la parte inferior de esta página. Total 30 Páginas | ||
|
No Preview Available !
Si85xx
Si85XX UNIDIRECTIONAL AC CURRENT SENSORS
Features
Single-chip ac current sensor
Low loss: <1.3 m primary series
resistance and <2 nH inductance
Leading-edge noise suppression
eliminates need for leading-edge
blanking
"Ping-Pong" output version allows
one Si85xx to replace two current
transformers in full-bridge designs
5, 10, and 20 A full-scale versions
±5% initial accuracy
50 kHz to 1 MHz input frequency
range
FAULT output to safeguard operation
Large 2 VPP min output at full scale
High-side or low-side current sensing
Compact 4x4x1 mm QFN package
(1 kVRMS isolation)
20-pin wide-body SOIC
(5 kVRMS isolation)
–40 to 125 °C operating range
UL/VDE/CSA approval
Applications
Power supplies
Motor controls
Lighting equipment
Industrial equipment
Description
The Si85xx products are unidirectional ac current sensors available in full-scale
ranges of 5, 10, and 20 A. Si85xx products are ideal upgrades for older current-
sensing technologies offering size, performance, and cost advantages over current
transformers, Hall effect devices, DCR circuits, and other approaches. The Si85xx
are extremely low-loss, adding less than 1.3 m of series resistance and less than
2 nH series inductance in the sensing path at 25 °C. Current-sensing terminals are
isolated from the other package pins, providing up to 5 kVRMS isolation level per
safety approval ratings.
Safety Approval (20-Pin SOIC Only)
UL 1577 recognized
5000 VRMS for 1 minute
CSA component notice 5A approval
IEC 60950, 61010, 60601
approved
VDE certification conformity
IEC 60747-5-2 (VDE0884 Part 2)
Functional Block Diagram
Ordering Information:
See page 26.
Pin Assignments:
See page 24
VDD
MODE
R1
R2
R3
R4
OUT1
OUT2
TRST/FAULT
GND
20-Pin SOIC
Si851x
IIN
IIN
IIN
IIN
IIN
IOUT
IOUT
IOUT
IOUT
IOUT
12-Pin QFN
IIN R1 R2 R3 R4
Si851x
RESET LOGIC
MODE LOGIC
MODE
INTEGRATOR
SIGNAL CONDITIONING
OUT1
OUT2
TEMP
SENSOR
ADC
AUTO CALIBRATION
LOGIC
IOUT
GND
VDD
TRST/FAULT
VDD
VIN
VDD1 TRST
IIN
R2
GND1 Si850x
OUT
R1 IOUT GND2
PH1
PH2
Q1
L VOUT
C
Q2
Typical Application
R1
R2
R3
R4
OUT1
OUT2
IIN
Si851x
IOUT
Patents pending
Preliminary Rev. 0.4 6/12
Copyright © 2012 by Silicon Laboratories
Si85xx
This information applies to a product under development. Its characteristics and specifications are subject to change without notice.
1 page  
Si85xx
Table 1. Electrical Specifications (Continued)
TA = –40 to +125 ºC (typical specified at 25 ºC), VDD = 3 V (±10%) to 5 V (±10%), f = 400 kHz, unless specified
Parameter
Conditions
Min Typ Max
OUT, OUT1, OUT2 Offset Voltage
(VOUTMIN)
VOUT Slew Rate1,2
Current flow from IIN to IOUT = 0 — 50 —
OUT, OUT1, OUT2 load = 5K || 50 pF — 50 —
OUT, OUT1, OUT2 Output Resistance
20 — 130
Total Measurement Error (%)
(–40 to 125 ºC Temp Range)
20% of full scale3,4 (all devices) –30 — +30
100% of full scale3,4
–10 — +10
Notes:
1. Guaranteed by design and/or characterization.
2. Maximum output load is not recommended to exceed 200 pF and 5 k.
3. Production tested at 400 kHz (50% duty cycle) at VDD = 3.3 V.
4. See "2.4. Total Measurement Error" on page 11 for more information.
Unit
mV
V/µs
%
%
Table 2. Regulatory Information1 (SOIC-20 Only)
CSA
The Si85xx is certified under CSA Component Acceptance Notice 5A. For more details, see File 232873.
VDE2
The Si85xx is certified according to IEC 60747-5-2. For more details, see File 5006301-4880-0001.
UL
The Si85xx is certified under UL1577 component recognition program. For more details, see File E257455.
Notes:
1. All 5.0 kVRMS rated devices are production tested to >6.0 kVRMS for 1 sec. For more information, see "6. Ordering
Guide" on page 26.
2. Pending.
Preliminary Rev. 0.4
5
5 Page 
Si85xx
Integrator reset Option 1 is selected by connecting TRST
to VDD. In this mode, the Si85xx is held in reset as long
as the signals on R1–R4 satisfy the logic equations of
Table 11. It is typically used in applications where the
gate drivers are external to the system controller IC (the
gate driver delay ensures reset is completed prior to the
start of measurement).
Reset Option 2 is selected by connecting a timing
resistor (RTRST in Figure 5) from the TRST input to
ground. It is typically used in applications where the
gate drivers are on-board the controller. In this mode,
the on-chip reset timer is triggered when the signals on
R1–R4 satisfy the logic equations in Table 11. Once
triggered, the timer maintains integrator in reset for time
duration tR as programmed by the value of resistor
RTRST. The user must select the value of resistor RTRST
to terminate the reset cycle prior to the start of
measurement under worst-case timing conditions. Note
that values of tR below the specified value in "1.
Electrical Specifications" on page 4 results in increased
integrator output offset error and increased output noise
on VOUT. Moreover, tR’s time is summarized by the
following equation (see Table 9):
tR = 10 ns/k
where values of RTRST that produce a reset time less
than 150 ns (RTRST < 15 k) should not be used.
Si85xx
2.4. Total Measurement Error
The Si85xx’s absolute accuracy is affected by the
following factors:
Ambient operating temperature
VDD supply voltage
Time
Table 10 includes a composite of all environmental and
operating conditions that can ultimately affect the
absolute measurement accuracy of the Si85xx. The
total worst-case accuracy at full scale can be estimated
by the sum of the initial accuracy (up to ±5%) plus aging
(up to ±1.5%) and supply variations (up to ±3.5%). For
example, the total measurement error expected for a
device operating at a given VDD supply of 5 V (±10%) is
10% if the device is operated over a temperature range
of –40 to 125 °C for up to 10 years. If the temperature
range is limited to 0 to 85 °C, the measurement error
can be improved by up to 2%. See Figure 6 for details.
Table 10. Total Measurement Error Contributors
Error Contributor
% Error Added
Initial error
@ given VDD ±10%, 25 °C
Temperature variation
–40 to 125 °C
Aging (10 years)
±5%
±3.5%
±1.5%
RTRST
TRST
Figure 5. Programming Reset Time (tR)
Table 9. Typical Reset Time vs. RTRST
Resistance
RTRST
15 k
100 k
1 M
2.2 M
Reset Time (tR)
150 ns
1 µs
9 µs
20 µs
2.5. Effect of Temperature on Accuracy
Offset voltage present at the Si85xx output terminals
(output offset voltage) is calibrated out each time VDD is
applied to the Si85xx; so, its error contribution is
minimized when the temperature at which calibration
occurred is at or near the steady-state operating
temperature of the Si85xx. For example, applying VDD
at 25 °C (offset cal is performed) and operating at 85 °C
will result in a larger offset error than operating at 50 °C.
The effect of this error is summarized in Figure 6. The
chart is referenced to 25 °C. If the Si85xx is powered up
at 25 °C and then operated at 125 °C with no auto-
calibration performed (i.e., the power is not cycled at
125 °C, which causes an auto-calibration), a 3%
measurement error can be expected.
Preliminary Rev. 0.4
11
11 Page | ||
| Páginas | Total 30 Páginas | |
| PDF Descargar | [ Datasheet Si8511.PDF ] | |
Hoja de datos destacado
| Número de pieza | Descripción | Fabricantes |
| Si8511 | UNIDIRECTIONAL AC CURRENT SENSORS | Silicon Laboratories |
| Si8512 | UNIDIRECTIONAL AC CURRENT SENSORS | Silicon Laboratories |
| Si8513 | UNIDIRECTIONAL AC CURRENT SENSORS | Silicon Laboratories |
| Si8517 | UNIDIRECTIONAL AC CURRENT SENSORS | Silicon Laboratories |
| Número de pieza | Descripción | Fabricantes |
| SLA6805M | High Voltage 3 phase Motor Driver IC. |
 Sanken |
| SDC1742 | 12- and 14-Bit Hybrid Synchro / Resolver-to-Digital Converters. |
 Analog Devices |
|
DataSheet.es es una pagina web que funciona como un repositorio de manuales o hoja de datos de muchos de los productos más populares, |
| DataSheet.es | 2020 | Privacy Policy | Contacto | Buscar |