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PDF A1335 Data sheet ( Hoja de datos )
| Número de pieza | A1335 | |
| Descripción | Precision Hall-Effect Angle Sensor IC | |
| Fabricantes | Allegro | |
| Logotipo |  |
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A1335
Precision Hall-Effect Angle Sensor IC
with I 2C, SPI, and SENT Interfaces
FEATURES AND BENEFITS
• 360° contactless high-resolution angle position sensor
• CVH (Circular Vertical Hall) technology
• Available with either a single die or dual independent die
housed within a single package
• Digital output format selectable among SPI, I2C, and
SENT (Single-Edge Nibble Transmission)
• SENT output is SAEJ2716 JAN2010 compliant, with
Allegro proprietary enhanced programmable features
• Customer-programmable SENT tick times, ranging
from 0.5 to 7.9 µs
• SPI interface allows use of multiple independent sensor
ICs for applications requiring redundancy
• Refresh rate: 32 µs, 12-bit resolution
• Wide range of diagnostics enable automotive applications
to achieve ASIL-D compliance
• Programmable via Manchester encoding on the VCC
line, reducing external wiring
• Automotive temperature range: –40°C to 150°C
• AEC-Q100 automotive qualified
• Two types of linearization algorithms offered: harmonic
linearization and segmented linearization
□□Enables off-axis operation
Continued on the next page…
Packages:
Not to scale
Single SoC, 14-pin TSSOP Dual Independent SoCs, 24-pin
(suffix LE)
TSSOP (suffix LE)
DESCRIPTION
TheA1335 is a 360° contactless high-resolution programmable
magnetic angle position sensor IC. It is designed for digital
systems and is capable of communicating via an I2C, SPI, or
SENT interface.
This system-on-chip (SoC) architecture includes a front
end based on Circular Vertical Hall (CVH) technology,
programmable microprocessor-based signal processing, and
features an interface capable of supporting I2C, SPI, and SENT.
Besides providing full-turn angular measurement, the A1335
also provides scaling for angle measurement applications less
than 360°. It includes on-chip EEPROM technology, capable of
supporting up to 100 read/write cycles, for flexible programming
of calibration parameters.
Digital signal processing functions, including temperature
compensation and gain/offset trim, as well as advanced output
linearization algorithms, provide an extremely accurate and
linear output for both end-of-shaft applications as well as
off‑axis applications.
TheA1335 is ideal for automotive applications requiring high-
speed 360° angle measurements, such as: electronic power
steering (EPS), transmission, torsion bar, and other systems
that require accurate measurement of angles. The A1335
linearization schemes were designed with challenging off-axis
applications in mind.
The A1335 is available as a single die in a 14-pin TSSOP, or
dual die in a 24-pin TSSOP. Both packages are lead (Pb) free
with 100% matte-tin leadframe plating.
V+
CBYP(VCC)
CBYP(BYP)
VCC (also
programming)
BYP
SENT
SDA/MISO
SCL/SCLK
SA0/CS
SA1/MOSI
ISEL
DGND
AGND
To all internal circuits
Regulator
SENT
Interface
Analog Front End
SOC Die
Multisegment
CVH Element
Diagnostics
Digital
Subsystem
I2C/SPI
Interface
VCC
(Programming)
EEPROM
32-bit
Microprocessor
ADC
Industry-leading linearization
enables off-axis (side-shaft)
operation
A1335-DS
Functional Block Diagram
1 page  
A1335
Precision Hall-Effect Angle Sensor IC
with I2C, SPI, and SENT Interfaces
OPERATING CHARACTERISTICS: Valid throughout full operating voltage and ambient temperature ranges, unless other-
wise specified
Characteristic
Symbol
Test Conditions
Min.
Typ.1
Max.
Unit2
Electrical Characteristics
Supply Voltage
Supply Current
VCC Low Flag Threshold
Supply Zener Clamp Voltage
Reverse Battery Voltage
Power-On Time3,4
SPI Interface Specifications5
VCC
ICC
VCCLOW(TH)
VZSUP IZCC = ICC + 3 mA, TA = 25°C
VRCC IRCC = –3 mA, TA = 25°C
tPO TA = 25°C
4.5 5 5.5
– 15 20
4.4 4.55 4.75
26.5 –
–
– – –18
2 – 40
V
mA
V
V
V
ms
Digital Input High Voltage3
VIH MOSI, SCLK, ¯C¯ ¯S¯ pins
2.8 – 3.63 V
Digital Input Low Voltage3
VIL MOSI, SCLK, ¯C¯ ¯S¯ pins
– – 0.5 V
SPI Output High Voltage
VOH MISO pins, TA = 25°C
2.93 3.3 3.69
V
SPI Output Low Voltage
VOL MISO pins
– 0.3 –
V
SPI Clock Frequency3
fSCLK MISO pins, CL = 50 pF
0.1 – 10 MHz
Chip Select to First SCLK Edge3
tCS Time from ¯C¯ ¯S¯ going low to SCLK falling edge
50
–
– ns
Data Output Valid Time3
tDAV Data output valid after SCLK falling edge
– 45 – ns
MOSI Setup Time3
tSU Input setup time before SCLK rising edge
10 –
– ns
MOSI Hold Time3
tHD Input hold time after SCLK rising edge
50 –
– ns
SCLK to ¯C¯ ¯S¯ Hold Time3
tCHD Hold SCLK high time before ¯C¯ ¯S¯ rising edge
5 – – ns
Load Capacitance3
CL Loading on digital output (MISO) pin
– – 50 pF
I2C Interface Specifications (VPU = 3.3 V on SDA and SCL pins)
Bus Free Time Between Stop
and Start3
tBUF
1.3 –
– µs
Hold Time Start Condition3
Setup Time for Repeated Start
Condition3
tHD(STA)
tSU(STA)
0.6 –
0.6 –
– µs
– µs
SCL Low Time3
SCL High Time3
Data Setup Time3
Data Hold Time3
Setup Time for Stop Condition3
Logic Input Low Level (SDA and
SCL pins)13
tLOW
tHIGH
tSU(DAT)
tHD(DAT)
tSU(STO)
VIL(I2C)
1.3 –
– µs
0.6 –
– µs
100 –
– ns
0 – 900 ns
0.6 –
– µs
– – 0.9 V
Logic Input High Level (SDA and
SCL pins)
VIH(I2C)
2.1 – 3.63 V
Continued on the next page…
Allegro MicroSystems, LLC
115 Northeast Cutoff
Worcester, Massachusetts 01615-0036 U.S.A.
1.508.853.5000; www.allegromicro.com
5
5 Page 
A1335
Precision Hall-Effect Angle Sensor IC
with I2C, SPI, and SENT Interfaces
Diagnostic Features
The A1335 was designed with diagnostic requirements in mind
and supports many on-chip diagnostics as well as error/status
flags, enabling the host microcontroller to assess the operational
status of each die.
In addition, the A1335 supports three different on-chip user-
initiated diagnostics.
USER-INITIATED DIAGNOSTICS
The following three internal self-tests may be configured to run
at power-on, and may also be initiated at any time by the system
microcontroller via Extended Access commands through the
SPI/I2C interface. A failure of any one of the three self-tests will
assert the Self-Test Failure Flag, ST, within the extended error
register. The specific failing test can be identified by performing
an extended address-read (address 0xFFFC).
• CVH Self-Test
The CVH self-test is a signal path diagnostic used to verify
both analog and digital system integrity. Test execution
requires approximately 36 ms, during which time no new
angle measurements will be generated by the sensor. The
test is implemented by changing the transducer switch
configuration from normal mode into a test configuration,
allowing a test current to drive the CVHD in place of the
magnetic field. By changing the direction of the test current
and sequencing different elements within the CVH, the self-
test emulates a changing magnetic field angle. The measured
angle is monitored to determine a passing or failing device.
A failure of the CVH self-test will assert the ST flag. If the
self-test was initiated via the Extended Access Command, test
results for the individual Hall elements will be stored in the
SRAM CmdStatus field (0x00) and the primary serial interface
ERD register (0x0E through 0x11).
• SRAM BIST
The SRAM Built-In Self-Test (BIST) verifies proper
functionality of the SRAM. The test may be run in either long
or short mode, and can be configured to halt on error. A failure
of the SRAM BIST will assert the ST flag. When enabled
to run on power-up, the short test mode is used, requiring
approximately 100 µs to complete. For more information on
SRAM BIST options, consult the A1335 programming guide.
Table 2: Status and Error Flags
Fault Condition
Description
Sensor Response
VCC < VCCLOW(TH)(min)
VCC > 8.8 V
Field > MAG_HIGH
Indicates potential for reduced angle accuracy
Indicates possible system level power supply failure
MAG_HIGH programmable from 0-1240 G in 40 G steps. Monitors Mag Field
level in case of mechanical failure
UV error flag is set
OV error flag is set*
MH flag is set
Field < MAG_LOW
MAG_LOW programmable from 0-620 G in 20 G steps. Monitors Mag Field
level in case of mechanical failure
ML flag is set
–60°C > TA > 180°C
Processor Halt
Ambient temperature beyond maximum rating detected
Monitors digital logic for proper functionality
TR flag is set
WT and WC Flags set
Single-Bit EEPROM Error (correctable)
Detects and corrects a single-bit EEPROM Error
ES error flag is set
Multi-Bit EEPROM Error (uncorrectable)
Detects a multi-bit uncorrectable EEPROM ERROR
EU error flag is set
Single-Bit SRAM Error (correctable)
Detects and corrects a single-bit SRAM Error
SS Error flag is set
Multi-Bit SRAM Error (uncorrectable)
Detects a multi-bit uncorrectable SRAM ERROR
SU Error flag is set
Angle-Processing Errors
New angle measurement did not occur within the maximum time allotted.
AT flag is set
Angle Out of Range
Angle value (prior to scaling by Gain) is outside the range set by MIN_ANGLE
and MAX_ANGLE. Short Stroke only.
The AL or AH flag is set
Loss of VCC
Determine if system power was lost. Also detects a reset of the internal
microprocessor
POR and RC flags are set
Self-Test Failure
Indicates a failure of one of the three internal self-tests. SRAM BIST, ROM
Checksum Verification, and CVH self-test. Tests can be individually configured
to run at power-up and may also be user initiated.
ST flag set
* EEPROM programming pulses result in OV flag assertion.
Allegro MicroSystems, LLC
115 Northeast Cutoff
Worcester, Massachusetts 01615-0036 U.S.A.
1.508.853.5000; www.allegromicro.com
11
11 Page | ||
| Páginas | Total 29 Páginas | |
| PDF Descargar | [ Datasheet A1335.PDF ] | |
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