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PDF MC10E158 Data sheet ( Hoja de datos )

Número de pieza MC10E158
Descripción 5-BIT 2:1 MULTIPLEXER
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MC10E158, MC100E158
5 V ECL 5‐Bit 2:1 Multiplexer
Description
The MC10E/100E158 contains five 2:1 multiplexers with
differential outputs. The output data are controlled by the Select input
(SEL).
The 100 Series contains temperature compensation.
Features
600 ps Max. D to Output
800 ps Max. SEL to Output
Differential Outputs
One VCCO Pin Per Output Pair
PECL Mode Operating Range:
VCC = 4.2 V to 5.7 V with VEE = 0 V
NECL Mode Operating Range:
VCC = 0 V with VEE = 4.2 V to 5.7 V
Internal Input 50 kW Pulldown Resistors
ESD Protection:
Human Body Model; > 2 kV
Machine Model; > 200 V
Meets or Exceeds JEDEC Standard EIA/JESD78 IC Latchup Test
Moisture Sensitivity Level: 3 (Pb-Free)
For Additional Information, see Application Note AND8003/D
Flammability Rating:
UL 94 V0 @ 0.125 in, Oxygen Index: 28 to 34
Transistor Count = 126 devices
These Devices are Pb-Free, Halogen Free and are RoHS Compliant
www.onsemi.com
PLCC28
FN SUFFIX
CASE 77602
MARKING DIAGRAM*
1
MCxxxE158FNG
AWLYYWW
xxx = 10 or 100
A = Assembly Location
WL = Wafer Lot
YY = Year
WW = Work Week
G = Pb-Free Package
*For additional marking information, refer to
Application Note AND8002/D.
ORDERING INFORMATION
Device
MC10E158FNG
MC10E158FNR2G
MC100E158FNG
Package
PLCC28
(Pb-Free)
PLCC28
(Pb-Free)
PLCC28
(Pb-Free)
Shipping
37 Units/Tube
500/Tape & Reel
37 Units/Tube
†For information on tape and reel specifications, in-
cluding part orientation and tape sizes, please refer
to our Tape and Reel Packaging Specifications
Brochure, BRD8011/D.
© Semiconductor Components Industries, LLC, 2016
July, 2016 Rev. 10
1
Publication Order Number:
MC10E158/D

1 page




MC10E158 pdf
MC10E158, MC100E158
Table 7. 100E SERIES NECL DC CHARACTERISTICS (VCCx = 0 V; VEE = 5.0 V (Note 1))
0°C
25°C
85°C
Symbol
Characteristic
Min Typ Max Min Typ Max Min Typ Max Unit
IEE Power Supply Current
VOH Output HIGH Voltage (Note 2)
VOL Output LOW Voltage (Note 2)
VIH Input HIGH Voltage
VIL Input LOW Voltage
IIH Input HIGH Current
D
SEL
1025
1810
1165
1810
33
950
1705
1025
1645
40
880
1620
880
1475
1025
1810
1165
1810
33
950
1745
1025
1645
40
880
1620
880
1475
1025
1810
1165
1810
38
950
1740
1025
1645
46
880
1620
880
1475
200 200 200
150 150 150
mA
mV
mV
mV
mV
mA
IIL Input LOW Current
0.5 0.3
0.5 0.25
0.5 0.2
mA
NOTE: Device will meet the specifications after thermal equilibrium has been established when mounted in a test socket or printed circuit
board with maintained transverse airflow greater than 500 lfpm. Electrical parameters are guaranteed only over the declared
operating temperature range. Functional operation of the device exceeding these conditions is not implied. Device specification limit
values are applied individually under normal operating conditions and not valid simultaneously.
1. Input and output parameters vary 1:1 with VCC. VEE can vary 0.46 V / +0.8 V.
2. Outputs are terminated through a 50 W resistor to VCC 2.0 V.
Table 8. AC CHARACTERISTICS (VCCx = 5.0 V; VEE = 0.0 V or VCCx = 0.0 V; VEE = 5.0 V (Note 1))
0°C 25°C
Symbol
Characteristic
Min Typ Max Min Typ Max Min
fMAX
tPLH
tPHL
Maximum Toggle Frequency
Propagation Delay to Output
D
SEL
700 1100
700 1100
700
250 500 650 250 500 650 250
450 700 825 450 700 825 450
85°C
Typ
1100
500
700
Max Unit
MHz
ps
650
825
tSKEW
tJITTER
tr
tf
Within-Device Skew (Note 2)
Random Clock Jitter (RMS)
Rise/Fall Time
(20 - 80%)
60 60 60 ps
< 1 < 1 < 1 ps
ps
275 425 650 275 425 650 275 425 650
NOTE: Device will meet the specifications after thermal equilibrium has been established when mounted in a test socket or printed circuit
board with maintained transverse airflow greater than 500 lfpm. Electrical parameters are guaranteed only over the declared
operating temperature range. Functional operation of the device exceeding these conditions is not implied. Device specification limit
values are applied individually under normal operating conditions and not valid simultaneously.
1. 10 Series: VEE can vary 0.46 V / +0.06 V.
100 Series: VEE can vary 0.46 V / +0.8 V.
2. Within-device skew is defined as identical transitions on similar paths through a device.
www.onsemi.com
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