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PDF MC10E157 Data sheet ( Hoja de datos )
| Número de pieza | MC10E157 | |
| Descripción | QUAD 2:1 MULTIPLEXER | |
| Fabricantes | ON Semiconductor | |
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MC10E157, MC100E157
5 V ECL Quad 2:1
Multiplexer
Description
The MC10E/100E157 contains four 2:1 multiplexers with
differential outputs. The output data are controlled by the individual
Select (SEL) inputs. The individual select control makes the devices
well suited for random logic designs.
The 100 Series contains temperature compensation.
Features
• Individual Select Controls
• 550 ps Max. D to Output
• 800 ps Max. SEL to Output
• PECL Mode Operating Range: VCC = 4.2 V to 5.7 V
with VEE = 0 V
• NECL Mode Operating Range: VCC= 0 V
with VEE = −4.2 V to −5.7 V
• Internal Input 50 kW Pulldown Resistors
• ESD Protection: Human Body Model; > 2 kV,
Machine Model; > 200 V
Charged Device Model; > 2 kV
• Meets or Exceeds JEDEC Standard EIA/JESD78 IC Latchup Test
• Moisture Sensitivity Level:
Pb = 1
Pb−Free = 3
For Additional Information, see Application Note AND8003/D
• Flammability Rating: UL 94 V−0 @ 0.125 in,
Oxygen Index: 28 to 34
• Meets or Exceeds JEDEC Spec EIA/JESD78 IC Latchup Test
• Transistor Count = 137 devices
• Pb−Free Packages are Available*
http://onsemi.com
PLCC−28
FN SUFFIX
CASE 776
MARKING DIAGRAM*
1
MCxxxE157FNG
AWLYYWW
xxx = 10 or 100
A = Assembly Location
WL = Wafer Lot
YY = Year
WW = Work Week
G = Pb−Free Package
*For additional marking information, refer to
Application Note AND8002/D.
ORDERING INFORMATION
See detailed ordering and shipping information in the package
dimensions section on page 6 of this data sheet.
*For additional information on our Pb−Free strategy and soldering details, please
download the ON Semiconductor Soldering and Mounting Techniques
Reference Manual, SOLDERRM/D.
© Semiconductor Components Industries, LLC, 2006
November, 2006 − Rev. 9
1
Publication Order Number:
MC10E157/D
1 page  
MC10E157, MC100E157
Table 7. 100E SERIES NECL DC CHARACTERISTICS VCCx = 0 V; VEE = −5.0 V (Note 7)
0°C
25°C
85°C
Symbol
Characteristic
Min Typ Max Min Typ Max Min Typ Max Unit
IEE Power Supply Current
32 38
32 38
37 44 mA
VOH Output HIGH Voltage (Note 8)
−1025 −950 −880 −1025 −950 −880 −1025 −950 −880 mV
VOL Output LOW Voltage (Note 8)
−1810 −1705 −1620 −1810 −1745 −1620 −1810 −1740 −1620 mV
VIH Input HIGH Voltage
−1165 −1025 −880 −1165 −1025 −880 −1165 −1025 −880 mV
VIL Input LOW Voltage
−1810 −1645 −1475 −1810 −1645 −1475 −1810 −1645 −1475 mV
VBB Output Voltage Reference
−1.38
−1.26 −1.38
−1.26 −1.38
−1.26 V
IIH Input HIGH Current
D 200 200 200 mA
SEL 150 150 150 mA
IIL Input LOW Current
0.5 0.3
0.5 0.25
0.5 0.2
mA
NOTE: Device will meet the specifications after thermal equilibrium has been established when mounted in a test socket or printed circuit
board with maintained transverse airflow greater than 500 lfpm. Electrical parameters are guaranteed only over the declared
operating temperature range. Functional operation of the device exceeding these conditions is not implied. Device specification limit
values are applied individually under normal operating conditions and not valid simultaneously.
7. Input and output parameters vary 1:1 with VCC. VEE can vary −0.46 V / +0.8 V.
8. Outputs are terminated through a 50 W resistor to VCC − 2.0 V.
Table 8. AC CHARACTERISTICS VCCx= 5.0 V; VEE = 0.0 V or VCCx = 0.0 V; VEE = −5.0 V (Note 9)
0°C 25°C
Symbol
Characteristic
Min Typ Max Min Typ Max
fMAX
Maximum Toggle Frequency
700 1100
700 1100
tPLH Propagation Delay to Output
tPHL
D 220 380 550 220 380 550
SEL 425 600 800 425 600 800
Min
700
220
425
85°C
Typ
1100
380
600
Max Unit
MHz
ps
550
800
tSKEW
tJITTER
tr
tf
Within-Device Skew (Note 10)
Random Clock Jitter (RMS)
Rise/Fall Time
(20 - 80%)
70 70 70 ps
< 1 < 1 < 1 ps
ps
275 400 650 275 400 650 275 400 650
NOTE: Device will meet the specifications after thermal equilibrium has been established when mounted in a test socket or printed circuit
board with maintained transverse airflow greater than 500 lfpm. Electrical parameters are guaranteed only over the declared
operating temperature range. Functional operation of the device exceeding these conditions is not implied. Device specification limit
values are applied individually under normal operating conditions and not valid simultaneously.
9. 10 Series: VEE can vary −0.46 V / +0.06 V.
100 Series: VEE can vary −0.46 V / +0.8 V.
10. Within-device skew is defined as identical transitions on similar paths through a device.
http://onsemi.com
5
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| PDF Descargar | [ Datasheet MC10E157.PDF ] | |
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